C8051F022 Datasheet PDF - Silicon Labs

● ANALOG PERIPHERALS

● SAR ADC

● 10-Bit

● ± 1 LSB INL

● Programmable Throughput up to 100 ksps

● Up to 8 External Inputs; Programmable as Single-Ended or Differential

● Programmable Amplifier Gain: 16, 8, 4, 2, 1, 0.5

● Data-Dependent Windowed Interrupt Generator

● Built-in Temperature Sensor (± 3°C)

● 8-bit ADC

● Programmable Throughput up to 500 ksps

● 8 External Inputs

● Programmable Amplifier Gain: 4, 2, 1, 0.5

● Two 12-bit DACs

● Can Synchronize Outputs to Timers for Jitter-Free Wave- form Generation

● Two Analog Comparators

● Voltage Reference

● Precision VDD Monitor/Brown-Out Detector

● ON-CHIP JTAG DEBUG & BOUNDARY SCAN

● On-Chip Debug Circuitry Facilitates Full- Speed, Non-Intrusive In-Circuit/In-System Debugging- Provides Breakpoints, Single-Stepping, Watchpoints, Stack Monitor; Inspect/Modify Memory and Registers

● Superior Performance to Emulation Systems Using ICEChips, Target Pods, and Sockets

● IEEE1149.1 Compliant Boundary Scan

● Low-Cost, Complete Development Kit