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STM8S003F3 User Reference Manual Guide

Part Series:
STM8S003F3 Series
Category:
Microcontrollers
Description:
MCU 8Bit STM8 CISC 8KB Flash 3.3V/5V 20Pin TSSOP Tube
Updated Time: 2023/01/13 01:35:13 (UTC + 8)

STM8S003F3 Microcontrollers User Reference Manual Guide

STM8S003F3P6 - ST Microelectronics Specifications

TYPE
DESCRIPTION
Mounting Style
Surface Mount
Frequency
16 MHz
Number of Pins
20 Pin
Supply Voltage (DC)
2.95V (min)
Operating Voltage
2.95V ~ 5.5V
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STM8S003F3P6 - ST Microelectronics Function Overview

The STM8S003F3P6 is a value line 8-bit Microcontroller offers 8kb flash program memory, plus integrated true data EEPROM. The value line device provides the following benefits performance, robustness and reduced system cost. Device performance and robustness are ensured by true data EEPROM supporting up to 100000 write/erase cycles, advanced core and peripherals made in a state-of-the-art technology at 16MHz clock frequency, robust I/Os, independent watchdogs with separate clock source and a clock security system.
16MHz Advanced STM8 Core with Harvard Architecture and 3-stage Pipeline
Extended Instruction Set
8kb Flash Memory, Data Retention 20 Years at 55°C after 100 Cycles Program Memory
1kb RAM
128-byte True Data EEPROM, Endurance up to 100K Write/Erase Cycles Data Memory
Flexible Clock Control, 4 Master Clock Sources
Low-power Crystal Resonator Oscillator
External Clock Input
Internal, User-trimmable 16MHz RC
Internal Low-power 128kHz RC
Clock Security System with Clock Monitor
Low-power Modes (Wait, Active-halt, Halt)
Switch-off Peripheral Clocks Individually
Permanently Active, Low-consumption Power-on and Power-down Reset
Nested Interrupt Controller with 32 Interrupts
Up to 27 External Interrupts on 6 Vectors
16-bit, 4 CAPCOM channels, Dead-time insertion and flexible synchronization advanced control timer
16-bit General Purpose Timers with 3 CAPCOM Channels (IC, OC or PWM)
8-bit Basic Timer with 8-bit Pre-scaler
Auto Wakeup Timer
Based on three different tests (ESD, LU) using specific measurement methods, the device is stressed in order to determine its performance in terms of electrical sensitivity.
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